The JEOL JSM-6390 Scanning Electron Microscope (SEM) enables high resolution observation of specimen surface structure. It offers a range of features which allow easy acquisition of high quality SEM micrographs. Imaging at low accelerating voltage, whilst still maininging good resolution, is possible and handy for specimens that are particularly reactive to the electron beam. Another nice feature is the low minimum magnification, which facilitates efficient survey of moderate to large sized specimens at high resolution. The user interface is intuitive and customisable. It also includes a built-in measurement feature, so that you can quantify the dimensions of a structure of interest while you are imaging.
- Accelerating voltage: 0.5 kV to 30 kV
- Resolution: 3 nm (at 30 kV), 15 nm (at 1 kV)
- Magnification 5x to 300,000x
- Fully automated electron gun
- Everhart-Thornley secondary electron detector
- Eucentric specimen stage
- Maximum specimen diameter: 150 mm
- Frame size: up to 2560 x 1920 pixels
Examples of use:
- Detailed characterisation of mutant phentoypes of whole organisms (eg: HeLa cells, Drosphilia, C. elegans and Arabidopsis)
- Examination of particulate samples (eg: pollen, powder)
- Characterisation of the effect of treatment conditions on biological specimens
- Observation of cells grown on artificial artificial material (eg: scaffolds)
If you would like to find out more about this microscope or would like to discuss SEM imaging options for your research, please contact Errin Johnson.